为利用硅橡胶材料的电导电流特性对复合绝缘子进行老化状态评估，以现场运行的复合绝缘子为试验对象进行研究。通过电导电流测试得到不同运行年限试样的电老化阈值，并根据电老化阈值评估试样的老化状态，再通过静态接触角测量结果分析试样的憎水性，最后利用扫描电镜测试分析试样的表面微观。初步试验发现，试样的老化程度越严重，其陷阱能级越深、电老化阈值越低、电导电流数值越大；新试样的电老化阈值在10 kV/mm左右，运行15 a的试样电老化阈值在5.5 kV/mm 左右；老化严重的试样电导电流较新试样要高出数倍；陷阱载流子密度与电老化阈值成正比关系；试样的电老化阈值与其憎水性、表面微观有着高度的对应关系。研究表明，通过硅橡胶材料的电导电流测试得到的电老化阈值，基本可以反映绝缘材料老化状态，电老化阈值有可能会成为硅橡胶复合绝缘子老化状态评估的新判据。

To assess the aging state of composite insulator by conduction current characteristic of silicon rubber material, the composite insulators being operated in the field are taken as samples. Through the testing of conduction current the electrical degradation thresholds for the samples experienced different operated durations are achieved; according to the electrical degradation thresholds the aging states of the samples are assessed;the hydrophobicity of samples is analyzed by the measured results of static contact angles is analyzed; finally, the surface micro textures of samples are tested and analyzed by scanning electron microscope. Preliminary tests found that the more serious aging degree of samples, the deeper their trap levels are, and the lower the electrical degradation threshold, the larger the conduction current values are; the electrical degradation threshold of the sample with shorter operation duration is about 10kV/mm, and the electrical degradation threshold o

本研究通过采样开路电压，短路电流，工作时刻的电压以及电流，建立P-V方程，从而求出最大功率电压，实现最大功率电压跟踪。通过算例分析验证，此算法可行，而且相比固定电压法跟踪更精确，相比增量电导法无震荡的缺点。

In this study, samples open circuit voltage, short circuit current, the operating time of the voltage and current to establish the equation PV, thereby obtaining the maximum power voltage, the maximum power voltage tracking. Through numerical examples show that this algorithm is feasible and tracking compared to fixed voltage method is more accurate than the incremental conductance method shortcomings without shocks.

采用密度泛函理论和非平衡格林函数相结合的方法对Si4团簇与Au(100)电极空位相连的纳米结点的电子输运性质进行了理论模拟计算，得到了纳米结点在不同距离下的几何结构、电子结构、电导、透射谱、电荷转移量；讨论了当距离dz=12.004?A时纳米结点的电导、电流随电压的变化关系.

Electron transport properties of Si4 cluster-Au (100) electrode nanojunction is investigated with a combination of density func-tional theory and non-equilibrium Green’s function method. We calculate the geometric structures, electronic structures, conductances, transmission spectra and charge transfers of Au-Si4-Au nanoscale junctions under different distances. We also discuss the variations of conductance and current with external voltage when the distance of junction is 12.004 ?A.

运用密度泛函理论结合非平衡格林函数对6个Si原子构成的直线链两侧以对顶位、对空位分别与理想Au(100)3×3半无限电极耦合的纳米结点结构的电子输运特性进行了第一性原理计算.计算结果得到对空位结构比对顶位结构更稳定,电导性也更好,电导随着正负电压的增大而略有减小,且呈现出对称性变化,其电流电压曲线表现出线性特征.

The properties of electron transport through a linear silicon atomic chain, which was made up of 6 atoms and sandwiched between Au(100) 3 × 3 electrodes, was investigated with a combination of density functional theory and the non-equilibrium Green’s function method. The results show that the structure of hollow-hollow configuration was more stable than that of the top-top configuration, and it had greater equilibri-um conductance. With the increase of the positive and negative voltages, the conductance of the hollow-hollow configuration decreased, and a symmetric change occurred. And the I-V curve of the hollow-hollow configu-ration showed linear characteristics.

采用微乳化-热液法制备了一系列氧化锆（ZrO2）改性的纳米氧化铝分散液，然后用原位聚合法制备了相应的氧化锆复配纳米氧化铝杂化聚酰亚胺复合薄膜，并对其进行了TEM表征、电气强度和电导电流测试以及电老化阈值分析。结果表明：掺杂氧化锆复配纳米氧化铝的杂化聚酰亚胺复合薄膜的电气强度大幅提高，当ZrO2的掺杂量为7%时，电气强度达到最高为396.8 MV/m；其电导电流密度、电老化阈值均高于只掺杂纳米氧化铝的聚酰亚胺薄膜，且随ZrO2含量增加均出现先增大后减小的趋势。

A series of nano-alumina dispersed solution modified by zirconia were prepared by micro emul-sion-hydrothermal method, and a zirconia/nano-alumina hybrid polyimide(PI) film was prepared through in-situ polymerization method, and then the films were characterized by TEM, and its electric strength, conduction current density and electric degradation threshold were analyzed. The results show that the doping of zirconia/nano-alumina can increase the electric strength of the film. When the ZrO2 doping con-tent is 7%, the electric strength attain maximum which is 396.8 kV/mm. The conduction current density and electric degradation threshold of the zirconia/nano-alumina hybrid PI films are higher than that of the PI film doped by nano-alumina only, and they increase first and then decrease with the increase of ZrO2 content.