SoC(System-on-a-Chip)芯片设计中,由于芯片测试引脚数目的限制以及基于芯片性能的考虑,通常有一些端口不能进行测试复用的IP(Intellectual Property)核将不可避免地被集成在SoC芯片当中.对于端口非测试复用IP核,由于其端口不能被直接连接到ATE(Automatic Test Equipment)设备的测试通道上,由此,对端口非测试复用IP核的测试将是对SoC芯片进行测试的一个重要挑战.在本文当中,我们分别提出了一种基于V93000测试仪对端口非测试复用ADC(Analog-to-Digital Converter)以及DAC(Digita-l to-Analog Converter)IP核的性能参数测试方法.对于端口非测试复用ADC和DAC IP核,首先分别为他们开发测试程序并利用V93000通过SoC芯片的EMIF(External Memory Interface)总线对其进行配置.在对ADC和DAC IP核进行配置以后,就可以通过V93000捕获ADC IP核采样得到的数字代码以及通过V93000采样DAC IP核转换得到的模拟电压值,并由此计算ADC以及DAC IP核的性能参数.实验结果表明,本文分别提出的针对端口非测试复用ADC以及DAC IP核测试方案非常有效.
IP cores without I/O multiplexing are typically unavoidable to be embedded into SoC due to the necessary consid-erations such as pin constraint and performance optimization during the design stage .Hence ,one of the serious challenges for SoC testing is how to effectively test IP cores without I/O multiplexing because the ports of IP cores without I/O multiplexing cannot be directly connected to the ATE channels .In this paper ,we propose test methods for ADC and DAC IP cores without I/O multiplex-ing using V93000 ATE respectively .In order to test the ADC and DAC IP cores without I/O multiplexing ,test programs are firstly developed and loaded into V93000 to configure the two cores via EMIF bus .Then the digital codes and the analog voltage values re-spectively converted by ADC and DAC IP cores of SoC are captured by V93000 for performance parameter calculation .Experimen-tal results show that the proposed methods are effective .